Analysis
We provide two-dimensional nanoscale electrical properties measurement and imaging. Advanced electrical characterization technology and research into next generation semiconductor production equipment are our focus.
Cases
Advanced analysis of devices including solar cells, CMOS sensor, logic/power devices and other third generation of semiconductor materials such as GaN & SiC are provided.
Development
Experts with decades of industry experience give the partners professional and Personalized solutions
Commissioning Guide
Our purpose is to provide professional and high-quality service. We look forward to serving you.
News
Cutting-edge information about detection and analysis technologies are available here
About Us
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Analysis
Cases
Development
Commissioning Guide
News
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CAFM was used to detect epitaxially grown aluminum gallium nitride (AlGaN) on gallium nitride (GaN) substrate to determine the influence of Al components on the crystal structure and the two-dimensional distribution of conductive nanometers.
