Analysis

We provide two-dimensional nanoscale electrical properties measurement and imaging. Advanced electrical characterization technology and research into next generation semiconductor production equipment are our focus.

Cases

Advanced analysis of devices including solar cells, CMOS sensor, logic/power devices and other third generation of semiconductor materials such as GaN & SiC are provided.

Development

Experts with decades of industry experience give the partners professional and Personalized solutions

Commissioning Guide

Our purpose is to provide professional and high-quality service. We look forward to serving you.

News

Cutting-edge information about detection and analysis technologies are available here

About Us

Contact our team for business consulting and academic collaboration

Scanning microwave impedance microscope (SMM)

High sensitivity high vacuum scanning extended resistance microscope (SSRM)

Atomic force microscope (AFM)

Conductive atomic force microscope (CAFM)

Scanning electron microscope (SEM-EDS)

Transmission electron microscope (TEM-EDS)

Focused Ion Beam (FIB)

Scanning Capacitor Microscope (SCM)

Reverse Engineering