Analysis

We provide two-dimensional nanoscale electrical properties measurement and imaging. Advanced electrical characterization technology and research into next generation semiconductor production equipment are our focus.

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Advanced analysis of devices including solar cells, CMOS sensor, logic/power devices and other third generation of semiconductor materials such as GaN & SiC are provided.

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Semiconductor Laser

Carrier distribution measurement of vertical cavity surface emission laser (VCSEL)


[Summary] The laser realizes the particle number reversal of the non-equilibrium carrier through a certain excitation method between the energy band (conductive band and valence band) of the semiconductor material, or between the energy band and impurities (acceptor or donor) energy levels of the semiconductor material. When a large number of electrons in the state of inverted particle number recombination with holes, it produces an exciting emission effect. Therefore, for such devices, SMM is often used to evaluate whether carriers are accurately doped.

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