Analysis
We provide two-dimensional nanoscale electrical properties measurement and imaging. Advanced electrical characterization technology and research into next generation semiconductor production equipment are our focus.
- Scanning microwave impedance microscope (SMM)
- High sensitivity high vacuum scanning extended resistance microscope (SSRM)
- Atomic force microscope (AFM)
- Conductive atomic force microscope (CAFM)
- Scanning electron microscope (SEM-EDS)
- Transmission electron microscope (TEM-EDS)
- Focused Ion Beam (FIB)
- Scanning Capacitor Microscope (SCM)
- Reverse Engineering
Cases
Advanced analysis of devices including solar cells, CMOS sensor, logic/power devices and other third generation of semiconductor materials such as GaN & SiC are provided.
- Solar Cells
- Rechargeable Battery
- Power Device
- Image Sensor (CMOS Sensor)
- Wafer Substrate & EPI
- Ramp roughness AFM
- Reverse Analysis SMM&SSRM
- Gallium nitride (GaN)
- Silicon Carbide (SiC)
- 3rd and 4th generation semiconductors
- Graphene
- Semiconductor Laser
- Chip Multilayer Ceramic Capacitor (MLCC)
- Memory Device
Development
Experts with decades of industry experience give the partners professional and Personalized solutions
- Development of high sensitivity scanning microwave microscope (SMM) equipment
- Development of high sensitivity high vacuum scanning extension resistance microscope (SSRM) equipment
- Development of Lorentz scanning electron/ion microscope
- SSRM (Scanning Spread Resistance Microscopy) and SCM (Scanning Capacitance Microscopy): Principle Comparison and R&D Applications
Commissioning Guide
Our purpose is to provide professional and high-quality service. We look forward to serving you.
News
Cutting-edge information about detection and analysis technologies are available here
About Us
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Analysis
- Scanning microwave impedance microscope (SMM)
- High sensitivity high vacuum scanning extended resistance microscope (SSRM)
- Atomic force microscope (AFM)
- Conductive atomic force microscope (CAFM)
- Scanning electron microscope (SEM-EDS)
- Transmission electron microscope (TEM-EDS)
- Focused Ion Beam (FIB)
- Scanning Capacitor Microscope (SCM)
- Reverse Engineering
Cases
- Solar Cells
- Rechargeable Battery
- Power Device
- Image Sensor (CMOS Sensor)
- Wafer Substrate & EPI
- Ramp roughness AFM
- Reverse Analysis SMM&SSRM
- Gallium nitride (GaN)
- Silicon Carbide (SiC)
- 3rd and 4th generation semiconductors
- Graphene
- Semiconductor Laser
- Chip Multilayer Ceramic Capacitor (MLCC)
- Memory Device
Development
- Development of high sensitivity scanning microwave microscope (SMM) equipment
- Development of high sensitivity high vacuum scanning extension resistance microscope (SSRM) equipment
- Development of Lorentz scanning electron/ion microscope
- SSRM (Scanning Spread Resistance Microscopy) and SCM (Scanning Capacitance Microscopy): Principle Comparison and R&D Applications
Commissioning Guide
News