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Development of high sensitivity scanning microwave microscope (SMM) equipment
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Development of high sensitivity high vacuum scanning extension resistance microscope (SSRM) equipment
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Development of Lorentz scanning electron/ion microscope
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SSRM (Scanning Spread Resistance Microscopy) and SCM (Scanning Capacitance Microscopy): Principle Comparison and R&D Applications
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Development of Lorentz scanning electron/ion microscope
Traditional SEM images existBackground out of focusAnd distorted issues

Set up the developed by our team below the sampleCopper grating

After a series of special conversions, it is displayedMagnetic field intensity distribution diagramSample diagram of

After a series of special conversions, it is displayedElectric field intensity distribution diagramSample diagram of
