With the continuous advancement of Moore's Law, semiconductor devices have already entered the nanometer era. As the structure of chips becomes more and more complex, traditional characterization methods (such as TEM/SEM) gradually reveal their limitations in "electrical characteristic analysis". How to accurately detect the "electrical context" of a chip in the nanometer world invisible to the naked eye?
In Shanghai Guozhiwei Technology Development Co., Ltd., there is such a senior "industry Holmes". She not only masters the core technology to solve this problem, but also has a profound semiconductor industry background that spans national borders. Today, let us enter the world of Dr. Zhang Li, chief scientist of Guozhiwei.
Dr. Zhang Li, chief scientist of Shanghai Guozhiwei Technology, was invited to give a special lecture at Fudan University
- Academic background: Bachelor’s and Master’s degree in Electronics, Tsinghua University
- Qualifications accumulation: more than 20 years of semiconductor research experience in large R&D centers
- Executive experience: Served as Azenta Life Sciences Japan Corporate Representative Director and President (CEO)
- Semiconductor nano-characterization research and technology management based on scanning probe microscopy
Technology Decoding—Breaking the Blind Spot, the Swordsman of the Nano World
In chip failure analysis and process development, if the traditional electron microscope is a "camera" that can clearly see the physical structure of the chip, thenelectrical scanning probe microscopy(eSPM) is an "electrocardiograph" that detects the electrical activity inside the chip.
As a top expert in this field, Dr. Zhang Li is good at realizing two-dimensional imaging and localized nano-detection of electrical properties through a single probe, providing key complementary means for those difficult and complicated diseases that cannot be confirmed by traditional methods.
Dr. Zhang dismantled the physical mechanism of the eSPM core technology matrix in detail during the lecture.
As shown above in Dr. Zhang's lecture at Fudan University, the Guozhiwei technical team she leads is proficient in a series of high-end detection methods such as SSRM (scanning extended resistance microscopy) and C-AFM (conductive atomic force microscopy). Whether it is logic chips, memory devices or third-generation semiconductors (such as GaN, SiC), Dr. Zhang can accurately "cut" on different material systems to explore the electrical truth hidden under the nanostructure.
Application implementation - simplifying the complex and leaving no trace of the chip structure
The greatness of a technology lies not only in its theoretical profundity, but also in how many practical problems it can solve for the industry. Dr. Zhang Li knows very well thatWhat customers need is not a bunch of cold raw data, but intuitive results that can directly guide process optimization.
The complex chip carrier concentration was transformed into an intuitive high-precision two-dimensional topography map under Dr. Zhang’s detection
Under her leadership, Guozhiwei's testing services are able to conduct high-precision two-dimensional testing of complex three-dimensional structures such as shallow pn junctions and FinFETs. Through quantitative carrier concentration analysis (as shown in the intuitive color heat map in the figure), Dr. Zhang’s team can help IC design companies and manufacturers in aspects such as device design, mechanism verification, yield improvement, and failure analysis.Provide "visible" reliable basis and significantly shorten the customer's R&D cycle。
Technical management—many years of experience, consulting services beyond measurement
If you just stop at "doing the test well", you are just an excellent engineer; but what Dr. Zhang Li brings to Guozhiwei's customers is even moreComprehensive transformation of “from measurement capabilities to customer value”。
More than 20 years of experience in semiconductor R&D, coupled with a management resume as president of Japan for a multinational foreign company, have given Dr. ZhangHighly technical and business perspective。
With his profound industry experience, Dr. Zhang can always provide customers with the best technology combination solutions.
Facing the complex testing needs of customers, Dr. Zhang is not only an executor, but also a senior consultant. As shown in the picture above, she is well aware of the advantages, disadvantages and applicable boundaries of various doping concentration measurement methods (such as SIMS, SCM, SSRM) in the industry.
she advocatesFrom the perspective of technology management, we not only help customers with testing, but also help customers with "technology portfolio optimization, resource coordination and risk management." Tell customers "what is the most effective test" and "how to test is the most cost-effective", truly transforming cutting-edge scientific instruments into powerful tools to protect customers’ business success.
Work with Guozhiwei to empower the future of semiconductor cores
“Explore materials deeper and create real value for customers.” This is Dr. Zhang Li’s insistence and alsoShanghai Guozhiwei Technology’s commitment to every customer。
haveFirst-class scientists are here, coupled with top-notch testing equipment, Shanghai Guozhiwei is committed to becoming the most trustworthy third-party testing and analysis partner for semiconductor companies.
[About Shanghai Guozhiwei Technology]
Shanghai Guozhiwei Technology Development Co., Ltd. is a technology company focusing on semiconductor chip analysis and testing. The business focuses on the application and development of scanning probe microscopes and transmission electron microscopes.Provide PFA (Physical Failure Analysis) physical and material failure analysis, electrical failure analysis (EFA) and other services.
Different from traditional testing institutions, the core technology differentiation advantage of Shanghai Guozhiwei Technology lies inExtremely high spatial resolution and ultra-high sensitivity. We are able to target cutting-edge complex architectures such as GAA (all-around gate transistor) and CFET (complementary field effect transistor), as well as various new devices and cutting-edge new materials such as power devices (Power Devices), optoelectronic devices, solar cells, etc.，Provide precise nanoscale electrical testing and characterization.
